Sc24 英

SC24 Magnetic Field Cancelling System

Electron microscopes have to operate in an ambient magnetic field comprising the earth’s field and fields radiated by electric power networks and electrical machines. When the ambient field changes, the electron beam in the microscope is deflected, causing loss of resolution and image distortion. The SC24 system stabilises the field by dynamically creating nearly equal and opposite field changes, so that the microscope performance is much improved.