Electron microscopes (EMs) are vital quality control (QC) tools in semiconductor production, helping manufacturers to guarantee a high standard of product. However, the precision of EMs and the resolution of resulting images can be hindered by external interruptions, such as acoustic noises, vibrations and magnetic fields.

Electron microscopes (EMs) are vital quality control (QC) tools in semiconductor production, helping manufacturers to guarantee a high standard of product. However, the precision of EMs and the resolution of resulting images can be hindered by external interruptions, such as acoustic noises, vibrations and magnetic fields.

The unparalleled magnification capabilities of electron microscopes (EMs) make them indispensable for applications requiring nanometre scale imaging.