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Spicer dual (2x) magnetic field cancelling system actively eliminates image interference in ferroelectric material researchContinuous environmental surveillance guarantees high-quality electron microscope imaging

Electron microscopes (EMs) are vital quality control (QC) tools in semiconductor production, helping manufacturers to guarantee a high standard of product. However, the precision of EMs and the resolution of resulting images can be hindered by external interruptions, such as acoustic noises, vibrations and magnetic fields.

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